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M68AW127 데이터시트(PDF) 10 Page - STMicroelectronics |
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M68AW127 데이터시트(HTML) 10 Page - STMicroelectronics |
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10 / 20 page ![]() M68AW127B 10/20 Table 7. Read and Standby Mode AC Characteristics Note: 1. Test conditions assume transition timing reference level = 0.3VCC or 0.7VCC. 2. At any given temperature and voltage condition, tGHQZ is less than tGLQX and tEHQZ is less than tELQX for any given device. 3. These parameters are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 4. Tested initially and after any design or process changes that may affect these parameters. Symbol Parameter M68AW127B Unit 70 100 tAVAV Read Cycle Time Min 70 100 ns tAVQV Address Valid to Output Valid Max 70 100 ns tAXQX (1) Data hold from address change Min 5 15 ns tEHQZ (2,3) Chip Enable High to Output Hi-Z Max 25 30 ns tELQV Chip Enable Low to Output Valid Max 70 100 ns tELQX (1) Chip Enable Low to Output Transition Min 5 10 ns tGHQZ (2,3) Output Enable High to Output Hi-Z Max 25 30 ns tGLQV Output Enable Low to Output Valid Max 35 50 ns tGLQX (2) Output Enable Low to Output Transition Min 5 5 ns tPD (4) Chip Enable or UB/LB High to Power Down Max 0 0 ns tPU (4) Chip Enable or UB/LB Low to Power Up Min 70 100 ns |
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