ACTQ403 datasheet(3/3 Pages) ACT

3 / 3 page

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3 OF 3

iCAUTION: Electrostatic Sensitive Device. Observe precautions for handling!

The frequency fC is the frequency of minimum IL with the resonator in the specified test fixture in a 50 Ω test

system with VSWR

≤ 1.2:1. Typically, fOSCILLATOR or fTRANSMITTER is less than the resonator fC.

Unless noted otherwise, case temperature TC = +25°C±2°C.

Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the

specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after

manufacture, decreasing in subsequent years.

Turnover temperature, T0, is the temperature of maximum (or turnover) frequency, f 0. The nominal frequency at

any case temperature, TC, may be calculated from: f = f 0 [1 - FTC (T0 - TC)

2]. Typically, oscillator T

0 is 20° less

than the specified resonator T0.

This equivalent RLC model approximates resonator performance near the resonant frequency and is provided

for reference only. The capacitance C0 is the measured static (non-motional) capacitance between either Pin 1

and ground or Pin 2 and ground. The measurement includes case parasitic capacitance.

Derived mathematically from one or more of the following directly measured parameters: f C, IL, 3 dB bandwidth,

fC versus TC, and C0.

The specifications of this device are based on the test circuit shown above and subject to change or

obsolescence without notice.

Typically, equipment utilizing this device requires emissions testing and government approval, which is the

responsibility of the equipment manufacturer.

Our liability is only assumed for the Surface Acoustic Wave (SAW) component(s) per se, not for applications,

processes and circuits implemented within components or assemblies.

Issue : 1 C1

Date : SEPT 04

ACTQ403 데이터시트(PDF) 3 Page - Advanced Crystal Technology