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ACTR30 데이터시트(PDF) 3 Page - Advanced Crystal Technology |
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ACTR30 데이터시트(HTML) 3 Page - Advanced Crystal Technology |
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3 / 3 page ![]() Tel : +44 118 979 1238 Fax : +44 118 979 1283 Email: info@actcrystals.com In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice. ISO9001: 2000 Registered - Registration number 6830/2 For quotations or further information please contact us at: 3 The Business Centre, Molly Millars Lane, Wokingham, Berks, RG41 2EY, UK http://www.actcrystals.com 3 OF 3 iCAUTION: Electrostatic Sensitive Device. Observe precautions for handling! 1. The centre frequency, fC, is measured at the minimum IL point with the resonator in the 50 Ω test system. 2. Unless noted otherwise, case temperature TC = +25°C±2°C. 3. Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after manufacture, decreasing in subsequent years. 4. Turnover temperature, T0, is the temperature of maximum (or turnover) frequency, f 0. The nominal frequency at any case temperature, TC, may be calculated from: f = f 0 [1 - FTC (T0 - TC) 2]. 5. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided for reference only. The capacitance C0 is the measured static (non-motional) capacitance between Pin1 and Pin2. The measurement includes case parasitic capacitance. 6. Derived mathematically from one or more of the following directly measured parameters: f C, IL, 3 dB bandwidth, fC versus TC, and C0. 7. The specifications of this device are based on the test circuit shown above and subject to change or obsolescence without notice. 8. Typically, equipment utilizing this device requires emissions testing and government approval, which is the responsibility of the equipment manufacturer. 9. Our liability is only assumed for the Surface Acoustic Wave (SAW) component(s) per se, not for applications, processes and circuits implemented within components or assemblies. Issue : 1 C1 Date : SEPT 04 |
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