CY74FCT16646T

CY74FCT162646T

4

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Storage Temperature .....................Com’l

−55°C to +125°C

Ambient Temperature with

Power Applied .................................Com’l

−55°C to +125°C

DC Input Voltage

.................................................−0.5V to +7.0V

DC Output Voltage

..............................................−0.5V to +7.0V

DC Output Current

(Maximum Sink Current/Pin)

...........................−60 to +120 mA

Power Dissipation .......................................................... 1.0W

Static Discharge Voltage............................................>2001V

(per MIL-STD-883, Method 3015)

Operating Range

Range

Ambient

Temperature

Industrial

−40°C to +85°C

5V

± 10%

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

−0.7

−1.2

V

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

−80

−140

−200

mA

−50

−180

mA

Power-Off Disable

[9]

±1

µA

Output Drive Characteristics for CY74FCT16646T

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

2.5

3.5

V

2.4

3.5

V

2.0

3.0

V

Output LOW Voltage

0.2

0.55

V

Output Drive Characteristics for CY74FCT162646T

Parameter

Description

Test Conditions

Min.

Max.

Unit

60

115

150

mA

−60

−115

−150

mA

Output HIGH Voltage

2.4

3.3

V

Output LOW Voltage

0.3

0.55

V

Notes:

4.

Stresses greater than those listed under Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect reliability.

5.

6.

This parameter is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametrics tests. In any sequence of parameter

8.

This parameter is measured at characterization but not tested.

9.

Tested at +25˚C.