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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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SMP100-200 데이터시트(PDF) 5 Page - STMicroelectronics |
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SMP100-200 데이터시트(HTML) 5 Page - STMicroelectronics |
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5 / 9 page  TEST CIRCUIT 2 for IH parameter. R -VP VBAT = - 48 V Surge generator D.U.T. This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within 50 ms max. 100 V / µs, di/dt < 10 A / µs, Ipp = 100 A 1kV / µs, di/dt < 10 A / µs, Ipp = 10 A U U 10 µF 2 Ω 45 Ω 66 Ω 470 Ω 83 Ω 0.36 nF 46 µH 60 µF 26 µH 12 Ω 250 Ω 46 µH 47 Ω KeyTek ’System 2’ generator with PN246I module KeyTek ’System 2’ generator with PN246I module TEST CIRCUITS 3 FOR VBO DYNAMIC PARAMETERS SMP100-xxx 5/9 |
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