| 전자부품 데이터시트 검색엔진 |
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SMTPB62 데이터시트(PDF) 3 Page - STMicroelectronics |
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SMTPB62 데이터시트(HTML) 3 Page - STMicroelectronics |
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3 / 5 page ![]() TEST CIRCUIT 1 FOR IBO and VBO parameters: TEST PROCEDURE : Pulse Test duration (tp = 20ms): - For Bidirectional devices = Switch K is closed - For Unidirectional devices = Switch K is open. VOUT Selection - Device with VBO < 200 Volt -VOUT = 250 VRMS,R1 = 140 Ω. - Device with VBO ≥ 200 Volt -VOUT = 480 VRMS,R2 = 240 Ω. TEST CIRCUIT 2 for IH parameter. This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T. 2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs. 3) The D.U.T will come back off-state within 50 ms max. R -VP VBAT = - 48 V Surge generator D.U.T. static relay. R1 R2 240 140 D.U.T V BO measure IBO measure tp = 20ms K Transformer 220V/800V 5A Auto Transformer 220V/2A Vout SMTPBxxx 3/5 |
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