 |
전자부품 데이터시트 검색엔진 |
|
|
전자부품 데이터시트 검색엔진 |
|
ST72325 데이터시트(PDF) 33 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
ST72325 데이터시트(HTML) 33 Page - STMicroelectronics |
|
|
33 / 196 page  33/196 SYSTEM INTEGRITY MANAGEMENT (Cont’d) 6.4.2.2 Monitoring a Voltage on the EVD pin This mode is selected by setting the AVDS bit in the SICSR register. The AVD circuitry can generate an interrupt when the AVDIE bit of the SICSR register is set. This in- terrupt is generated on the rising and falling edges of the comparator output. This means it is generat- ed when either one of these two events occur: –VEVD rises up to VIT+(EVD) –VEVD falls down to VIT-(EVD) The EVD function is illustrated in Figure 19. For more details, refer to the Electrical Character- istics section. Figure 19. Using the Voltage Detector to Monitor the EVD pin (AVDS bit=1) VEVD VIT+(EVD) VIT-(EVD) AVDF 0 0 1 IF AVDIE = 1 Vhyst AVD INTERRUPT REQUEST INTERRUPT PROCESS INTERRUPT PROCESS |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Korean ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
