| 전자부품 데이터시트 검색엔진 |
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T84C5112-RKFEV 데이터시트(PDF) 81 Page - ATMEL Corporation |
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T84C5112-RKFEV 데이터시트(HTML) 81 Page - ATMEL Corporation |
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81 / 97 page ![]() Rev. B - November 10, 2000 81 Preliminary T80C5112 3. Power Down ICC is measured with all output pins disconnected; Vpp = VSS; XTAL2 NC.; RST = VSS (see Figure 38.). 4. Not Applicable 5. Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temperature and 5V. 6. If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 7. For other values, please contact your sales office. 8. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure 39.), VIL = VSS + 0.5 V, VIH =VCC - 0.5V; XTAL2 N.C.; RST/Vpp= VCC;. The internal ROM runs the code 80 FE (label: SJMP label). ICC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when possible, which is the worst case. Figure 35. ICC Test Condition, under reset Figure 36. Operating ICC Test Condition VCC ICC (NC) CLOCK SIGNAL All other pins are disconnected. RST XTAL XTAL1 VSS VCC VCC ICC (NC) CLOCK SIGNAL All other pins are disconnected. RST XTAL XTAL1 VSS VCC Reset = Vss after a high pulse during at least 24 clock cycles VCC |
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