| 전자부품 데이터시트 검색엔진 |
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33879 데이터시트(PDF) 12 Page - Freescale Semiconductor, Inc |
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33879 데이터시트(HTML) 12 Page - Freescale Semiconductor, Inc |
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12 / 25 page ![]() Analog Integrated Circuit Device Data 12 Freescale Semiconductor 33879 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS TIMING DIAGRAMS Figure 4. SPI Timing Diagram Figure 5. Valid Data Delay Time and Valid Time Test Circuit Figure 6. Valid Data Delay Time and Valid Time Waveforms Figure 7. Enable and Disable Time Waveforms tDO(DIS) 0.7 VDD 0.2 VDD 0.2 VDD 0.7 VDD 0.2 VDD tLEAD tDO(EN) tDI(SU) tDI(HOLD) tVALID tLAG CS SCLK DI DO MSB in MSB out LSB out 0.7 VDD 0.2 VDD DO CL = 200 pF VDD = 5.0 V SCLK 33879 Under Test NOTE: CL represents the total capacitance of the test fixture and probe. (Low-to-High) tF(DI tR(DI) 0.2 VDD 0.7 VDD 0.2 0.7 VDD tVALID tR(DO VOL VOH VOL VOH 0.2 VDD 0.7 VDD 0 V 3.3/5.0 V < 50 ns 50% < 50 ns DO SCLK (High-to-Low) DO 90% tF(CS) tR(CS) VOH VOL 0 V 3.3/5.0 V DO tDO(DIS) tDO(EN) tDO(DIS) tDO(EN) (Tri-State to Low) 0.7 VDD 0.2 VDD <50 ns <50 ns CS 90% DO (Tri-State to High) 10% 10% 90% 10% VTri-State VTri-State |
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