| 전자부품 데이터시트 검색엔진 |
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33911 데이터시트(PDF) 16 Page - Freescale Semiconductor, Inc |
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33911 데이터시트(HTML) 16 Page - Freescale Semiconductor, Inc |
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16 / 45 page ![]() Analog Integrated Circuit Device Data 16 Freescale Semiconductor 33911 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS TIMING DIAGRAMS Figure 4. Test Circuit for Transient Test Pulses (LIN) Figure 5. Test Circuit for Transient Test Pulses (Lx) Figure 6. Test Circuit for LIN Timing Measurements Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b. LIN TRANSIENT PULSE PGND GENERATOR 1.0nF (NOTE) GND 33911 LGND AGND L1, L2 TRANSIENT PULSE PGND GENERATOR 1.0nF (NOTE) 10k Ω NOTE: Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b. GND 33911 LGND AGND R0 AND C0 COMBINATIONS: • 1.0K Ω and 1.0nF • 660 Ω and 6.8nF • 500 Ω and 10nF VSUP TXD RXD LIN R0 C0 C0 |
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