Symbol

Parameter

Stand-off voltage

Breakover voltage

Breakdown voltage

Holding current

Breakover current

Peak pulse current

C

Capacitance

αT

Temperature coefficient

°C)

V

I

V

RM

BO

V

RM

I

H

PP

I

I

Type

max.

note 1

max.

min.

note 2

C

typ.

max.

note 3

αT

typ.

note 4

µAV

V

mA

mA

pF

pF

10

°C

TPN3021

4

28

38

100

30

25

30

8

Note 1 : Between any I/O pin and Ground or between I/O1 and I/O2.

Note 2 : See the functional holding current (IH) test circuit.

Note 3 : Between any I/O pin and GND or between I/O1 and I/O2 at 0V bias, VRMS = 30 mV, F = 1 MHz.

Note 4 :

∆VBO = αTx (Tamb - 25) x VBO(25°C).

R

-V

P

V

BAT

48 V

=

Surge generator

-

D.U.T

TEST PROCEDURE :

µs.

- The D.U.T. will come back to the off-state within a duration of 50 ms max.

®

TPN3021

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