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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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74HC02DB 데이터시트(PDF) 7 Page - NXP Semiconductors |
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74HC02DB 데이터시트(HTML) 7 Page - NXP Semiconductors |
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7 / 15 page  74HC_HCT02_3 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 03 — 18 September 2008 7 of 15 NXP Semiconductors 74HC02; 74HCT02 Quad 2-input NOR gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC02 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT02 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
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