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LTC4261CUFD 데이터시트(PDF) 26 Page - Linear Technology

부품명 LTC4261CUFD
상세설명  Negative Voltage Hot Swap Controllers with ADC and I2C Monitoring
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LTC4261CUFD 데이터시트(HTML) 26 Page - Linear Technology

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LTC4261/LTC4261-2
26
42612fb
(DMY) to measure the internal clock cycle (i.e., the serial
data rate). Following the DMY bit are two channel code bits
CH1 and CH0 labeling the ADC channel (see Table 10). Ten
data bits of the ADC channel (ADC9-0) and three FAULT
register bits (B2, B1 and B0) are then sent out. A parity bit
(PRTY) ends each data stream. After that the SDAO line
enters the idle mode with SDAO pulled high.
The following data reception procedure is recommended:
0. Wait for INTVCC rising edge.
1. Wait for SDAO falling edge.
2. The first falling edge could be a glitch, so check again
after a delay of 10µs. If back to high, wait again. If still
low, it is the START bit.
3. Use the following low-to-high and high-to-low transis-
tions to measure 1/2 of the internal clock cycle.
4. Wait for the second low-to-high transistion (middle of
DMY bit).
5. Wait 3/4 of a clock cycle.
6. Sample bit CH1, wait for transistion.
7. Wait 3/4 of a clock cycle.
8. Sample bit CH0, wait for transistion.
9. Wait 3/4 of a clock cycle.
10. Sample ADC9, wait for transistion.
11. Continue until all bits are read.
The above procedure can be ported to a microcontroller
or used to design a state machine in FPGA. Code should
have timeouts in case an edge is missed. Abort the read
if it takes more than double the typical time (1.2ms) for
all 18 bits to be clocked out.
A typical application circuit with the LTC4261/LTC4261-2
in the broadcast mode is illustrated in Figure 17, where
input voltage, VDS of the FET and VSENSE are monitored.
Register Addresses and Contents
The register addresses and contents are summerized in
Table 1 and Table 2. The function of each register bit is
detailed in Tables 3 to 9.
APPLICATIONS INFORMATION



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