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SN54HC540J 데이터시트(PDF) 1 Page - Texas Instruments |
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SN54HC540J 데이터시트(HTML) 1 Page - Texas Instruments |
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1 / 6 page ![]() SN54HC540, SN74HC540 OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS SCLS007B – MARCH 1984 – REVISED MAY 1997 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D High-Current 3-State Outputs Drive Bus Lines Directly or up to 15 LSTTL Loads D Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) D Package Options Include Plastic (DW) and Ceramic Flat (W) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 300-mil DIPs description These octal buffers and line drivers feature the performance of the popular ’HC240 series and offer a pinout with inputs and outputs on opposite sides of the package. This arrangement greatly enhances printed circuit board layout. The 3-state control gate is a 2-input NOR. If either output-enable (OE1 or OE2) input is high, all eight outputs are in the high-impedance state. The ’HC540 provide inverted data at the outputs. The SN54HC540 is characterized for operation over the full military temperature range of –55 °C to 125 °C. The SN74HC540 is characterized for operation from –40 °C to 85°C. FUNCTION TABLE (each buffer/driver) INPUTS OUTPUT OE1 OE2 A Y L L L H L LH L H XX Z X H X Z Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 OE1 A1 A2 A3 A4 A5 A6 A7 A8 GND VCC OE2 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 SN54HC540 ...J OR W PACKAGE SN74HC540 . . . DW OR N PACKAGE (TOP VIEW) 32 1 20 19 910 11 1213 4 5 6 7 8 18 17 16 15 14 Y1 Y2 Y3 Y4 Y5 A3 A4 A5 A6 A7 SN54HC540 . . . FK PACKAGE (TOP VIEW) Copyright © 1997, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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