SN54LVC00A, SN74LVC00A

QUADRUPLE 2-INPUT POSITIVE-NAND GATES

SCAS279G – JANUARY 1993 – REVISED JUNE 1998

1

POST OFFICE BOX 655303

CMOS) Submicron Process

MIL-STD-883, Method 3015; Exceeds 200 V

Using Machine Model (C = 200 pF, R = 0)

JESD 17

Small-Outline (D), Shrink Small-Outline

(DB), and Thin Shrink Small-Outline (PW)

Packages, Ceramic Chip Carriers (FK),

Ceramic Flat (W) Package, and DIPs (J)

description

The SN54LVC00A quadruple 2-input positive-

operation and the SN74LVC00A quadruple

2-input positive-NAND gate is designed for 1.65-V

The ’LVC00A devices perform the Boolean

function Y = A

• B or Y = A + B in positive logic.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators

in a mixed 3.3-V/5-V system environment.

The SN54LVC00A is characterized for operation over the full military temperature range of –55

°C to 125°C. The

SN74LVC00A is characterized for operation from –40

°C to 85°C.

FUNCTION TABLE

(each gate)

INPUTS

OUTPUT

A

B

Y

H

H

L

L

XH

X

L

H

Copyright

© 1998, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

EPIC is a trademark of Texas Instruments Incorporated.

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

1Y

2A

2B

2Y

GND

4B

4A

4Y

3B

3A

3Y

SN54LVC00A ...J OR W PACKAGE

SN74LVC00A . . . D, DB, OR PW PACKAGE

(TOP VIEW)

32 1 20 19

910 11 1213

4

5

6

7

8

18

17

16

15

14

4A

NC

4Y

NC

3B

1Y

NC

2A

NC

2B

SN54LVC00A . . . FK PACKAGE

(TOP VIEW)

NC – No internal connection

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.