SUPERWORLD ELECTRONICS (S) PTE LTD

NOTE : Specifications subject to change without notice. Please check our website for latest information.

PG. 5

26.09.2008

CERAMIC CHIP INDUCTORS

C2 SERIES

The ferrite should not be damaged by forces

applied on the right condition.

Bending Strength

ITEM

1.0(0.039)

R0.5(0.02)

A

PERFORMANCE

TEST CONDITION

Chip

Appearance : No damage.

Inductance : Within ±20% of initial value.

High Temperature Resistance

Humidity : 90~95% RH.

Temperature : 60±2°C

Duration : 1008±12hrs

Duration : 1008±12hrs

Applied Current : rated current

Temperature : 85±5°C

Measurement : After placing for at least 24hrs.

Measurement : After placing for at least 24hrs.

Humidity Resistance

Measured : 100 times

Appearance : Cracking, chipping or any other

Phase

defects that are harmful to the characteristics

Low temperature storage test

Thermal Shock

Number of cycles : 100

Step2 : +85±5°C 30 min.

Duration : 1008±12hrs

Temperature : -40±2°C

Measurement : After placing for at least 24hrs.

Measurement : After placing for at least 24hrs.

+85±5°C

-40±2°C

2

1

30

30

For C Series :

Step1 : -40±2°C 30 min.

Condition for 1 cycle

Temperature (°C)

Times (min.)

8. RELIABILITY & TEST CONDITION :

Inductance : Within ±20% of initial value.

Applied Current : rated current (max.)

shall not be allowed.