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TL087CD 데이터시트(PDF) 1 Page - Texas Instruments |
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TL087CD 데이터시트(HTML) 1 Page - Texas Instruments |
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1 / 20 page ![]() TL087, TL088, TL287, TL288 JFET-INPUT OPERATIONAL AMPLIFIERS SLOS082A – D2484, MARCH 1979 – REVISED JANUARY 1993 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Copyright © 1993, Texas Instruments Incorporated 1 • Low Input Offset Voltage . . . 0.5 mV Max • Low Power Consumption • Wide Common-Mode and Differential Voltage Ranges • Low Input Bias and Offset Currents • High Input Impedance . . . JFET-Input Stage • Internal Frequency Compensation • Latch-Up-Free Operation • High Slew Rate . . . 18 V/µs Typ • Low Total Harmonic Distortion 0.003% Typ description These JFET-input operational amplifiers incorporate well-matched high-voltage JFET and bipolar transistors in a monolithic integrated circuit. They feature low input offset voltage, high slew rate, low input bias and offset currents, and low temperature coefficient of input offset voltage. Offset-voltage adjustment is provided for the TL087 and TL088. The C-suffix devices are characterized for operation from 0 °C to 70°C, and the I-suffix devices are characterized for operation from –40 °C to 85°C. The M-suffix devices are characterized for operation over the full military temperature range of – 55 °C to 125°C. AVAILABLE OPTIONS VIO max PACKAGE TA TYPE VIO max AT 25 °C SMALL OUTLINE (D) CERAMIC DIP (JG) PLASTIC DIP (P) FLAT (U) 0 °C to Single 0.5 mV 1 mV TL087CD TL088CD TL087CJG TL088CJG TL087CP TL088CP 70 °C Dual 0.5 mV 1 mV TL287CD TL288CD TL287CJG TL288CJG TL287CP TL288CP –40 °C to Single 0.5 mV 1 mV TL087ID TL088ID TL087IJG TL088IJG TL087IP TL088IP 85 °C Dual 0.5 mV 1 mV TL287ID TL288ID TL287IJG TL288IJG TL287IP TL288IP –55 °C to Single 1 mV TL088MJG TL088MU 125 °C Dual 1 mV TL288MJG TL288MU The D package is available taped and reeled. Add the suffix R to the device type (e.g., TL087CDR). PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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