SPT1175

ELECTRICAL SPECIFICATIONS

TEST

TEST

SPT1175

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Dynamic Performance

Signal-To-Noise Ratio

I

44

46

dB

I

43

45

dB

V

39

dB

Spurious Free

Dynamic Range

I

44

47

dB

I

41

44

dB

V

33

dB

Differential Phase

NTSC 20 IRE Mod Ramp

V

0.7

Degrees

Differential Gain

V

1.0

%

Digital Inputs

Input Current, Logic High

I

1.0

µA

Input Current, Logic Low

I

1.0

µA

Pulse Width High (CLK)

IV

15

ns

Pulse Width Low (CLK)

IV

15

ns

Voltage, Logic High

I

4.0

V

Voltage, Logic Low

I

1.0

V

Digital Outputs

Output Current, High

IV

-1.1

mA

Output Current, Low

IV

3.5

mA

Output Current, High Z

IV

16

µA

Voltage High

I

4.0

V

Voltage Low

I

0.4

V

Power Supply Requirements

IV

+4.75

+5.0

+5.25

V

IV

+4.75

+5.0

+5.25

V

Supply Voltage Difference

IV

-0.1

0.0

0.1

V

Supply Current

I

18

27

mA

Power Dissipation

I

90

135

mW

TEST PROCEDURE

100% production tested at the specified temperature.

at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and

characterization data.

Parameter is a typical value for information purposes only.

guaranteed over specified temperature range.

TEST LEVEL

I

II

III

IV

V

VI

TEST LEVEL CODES

All electrical characteristics are subject to the following

conditions:

All parameters having min/max specifications are guar-

anteed. The Test Level column indicates the specific

device testing actually performed during production

and Quality Assurance inspection. Any blank section in

the data column indicates that the specification is not

tested at the specified condition.

3

6/24/97