| 전자부품 데이터시트 검색엔진 |
|
SPT7852 데이터시트(PDF) 5 Page - Cadeka Microcircuits LLC. |
|
|
|||||||||||||||||||||||||||||
SPT7852 데이터시트(HTML) 5 Page - Cadeka Microcircuits LLC. |
|
5 / 11 page ![]() 5 1/12/00 SPT7852 OPERATING DESCRIPTION The general architecture for the CMOS ADC is shown in the block diagram. The design contains two sets of eight identical successive approximation ADC sections, all operating in par- allel, a 16-phase clock generator, an 11-bit 8:1 digital output multiplexer, correction logic, and a voltage reference genera- tor which provides common reference levels for each ADC section. The high sample rate is achieved by using multiple SAR ADC sections in parallel, each of which samples the input signal in sequence. Each ADC uses 16 clock cycles to complete a conversion. The clock cycles are allocated as follows: Table I – Clock Cycles Clock Operation 1 Reference zero sampling 2 Auto-zero comparison 3 Auto-calibrate comparison 4 Input sample 5–15 11-bit SAR conversion 16 Data transfer The 16-phase clock, which is derived from the input clock, synchronizes these events. The timing signals for adjacent ADC sections are shifted by two clock cycles so that the analog input is sampled on every other cycle of the input clock by exactly one ADC section. After 16 clock periods, the timing cycle repeats. The sample rate for the configura- tion is one-half of the clock rate, e.g., for a 40 MHz clock rate, the input sample rate is 20 MHz. The latency from ana- log input sample to the corresponding digital output is 12 clock cycles. • Since only sixteen comparators are used, a huge power savings is realized. • The auto-zero operation is done using a closed loop sys- tem that uses multiple samples of the comparator's re- sponse to a reference zero. • The auto-calibrate operation, which calibrates the gain of the MSB reference and the LSB reference, is also done with a closed loop system. Multiple samples of the gain error are integrated to produce a calibration voltage for each ADC section. • Capacitive displacement currents, which can induce sam- pling error, are minimized since only one comparator per VIN input samples the input during a clock cycle. • The total input capacitance is very low since sections of the converter which are not sampling the signal are iso- lated from the input by transmission gates. |
|
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |