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STM32F102X4 데이터시트(PDF) 59 Page - STMicroelectronics

부품명 STM32F102X4
상세설명  Low-density USB access line, ARM-based 32-bit MCU with 16/32 KB Flash, USB FS interface, 5 timers, ADC & 5 communication interfaces
PDF  69 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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STM32F102X4 데이터시트(HTML) 59 Page - STMicroelectronics

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STM32F102x4, STM32F102x6
Electrical characteristics
Doc ID 15057 Rev 3
59/69
Note:
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog pin. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins that may potentially inject
negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in
Section 5.3.12 does not affect the ADC accuracy.
Table 45.
RAIN max for fADC = 12 MHz
(1)
1.
Data guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (k)
1.5
0.13
0.4
7.5
0.63
5.9
13.5
1.13
11.4
28.5
2.38
25.2
41.5
3.46
37.2
55.5
4.63
50
71.5
5.96
NA
239.5
19.96
NA
Table 46.
ADC accuracy - limited test conditions(1)
1.
ADC DC accuracy values are measured after internal calibration.
Symbol
Parameter
Test conditions
Typ
Max(2)
2.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 48 MHz,
fADC = 12 MHz, RAIN < 10 k,
VDDA = 3 V to 3.6 V
TA = 25 °C
Measurements made after
ADC calibration
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
Table 47.
ADC accuracy(1) (2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
Better performance could be achieved in restricted VDD, frequency and temperature ranges.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 48 MHz,
fADC = 12 MHz, RAIN < 10 k,
VDDA = 2.4 V to 3.6 V
Measurements made after
ADC calibration
±2
±5
LSB
EO
Offset error
±1.5
±2.5
EG
Gain error
±1.5
±3
ED
Differential linearity error
±1
±2
EL
Integral linearity error
±1.5
±3



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