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ISO7421 데이터시트(PDF) 2 Page - Texas Instruments |
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ISO7421 데이터시트(HTML) 2 Page - Texas Instruments |
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2 / 18 page ![]() ABSOLUTE MAXIMUM RATINGS (1) ISO7421, ISO7421M SLLS984 – JUNE 2009....................................................................................................................................................................................................... www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. TERMINAL FUNCTIONS TERMINAL I/O DESCRIPTION NAME NO. INA 7 I Input, channel A INB 3 I Input, channel B GND1 4 – Ground connection for VCC1 GND2 5 – Ground connection for VCC2 OUTA 2 O Output, channel A OUTB 6 O Output, channel B VCC1 1 – Power supply, VCC1 VCC2 8 – Power supply, VCC2 FUNCTION TABLE(1) INPUT SIDE OUTPUT SIDE INPUT OUTPUT VCC VCC IN OUT H H PU PU L L Open H PD PU X H (1) PU = Powered up (VCC ≥ 3 V); PD = Powered down (VCC ≤ 2.4 V); X = Irrelevant; H = High level; L = Low level AVAILABLE OPTIONS RATED INPUT CHANNEL MARKED ORDERING PRODUCT PACKAGE RATED TA ISOLATION THRESHOLD DIRECTION AS NUMBER ISO7421D (rail) ISO7421 –40°C to 105°C IS7421 ISO7421DR (reel) ~1.5 V (TTL) Opposite 2.5 kVrms D-8 ISO7421MD (rail) (CMOS compatible) directions ISO7421M –55°C to 125°C I7421M ISO7421MDR (PREVIEW) (reel) VALUE VCC Supply voltage(2), VCC1, VCC2 –0.5 V to 6 V VI Voltage at IN, OUT –0.5 V to 6 V IO Output current ±15 mA Human-body model JEDEC Standard 22, Test Method A114-C.01 ±4 kV Electrostatic Field-induced charged-device ESD JEDEC Standard 22, Test Method C101 All pins ±1.5 kV discharge model Machine model ANSI/ESDS5.2-1996 ±200 V TJ(Max) Maximum junction temperature 150°C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): ISO7421 ISO7421M |
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