ATmega16 datasheet(353/357 Pages) ATMEL

353 / 357 page

2466S–AVR–05/09

ATmega16(L)

Prescaling and Conversion Timing 207

Changing Channel or Reference Selection 210

ADC Noise Canceler 211

ADC Conversion Result 216

JTAG Interface and On-chip Debug System 222

Features 222

Overview 222

Test Access Port – TAP 222

TAP Controller 224

Using the Boundary-scan Chain 225

Using the On-chip Debug System 225

On-chip Debug Specific JTAG Instructions 226

On-chip Debug Related Register in I/O Memory 227

Using the JTAG Programming Capabilities 227

Bibliography 227

IEEE 1149.1 (JTAG) Boundary-scan 228

Features 228

System Overview 228

Data Registers 228

Boundary-scan Specific JTAG Instructions 230

Boundary-scan Chain 232

ATmega16 Boundary-scan Order 241

Boundary-scan Description Language Files 245

Boot Loader Support – Read-While-Write Self-Programming 246

Features 246

Application and Boot Loader Flash Sections 246

Read-While-Write and no Read-While-Write Flash Sections 246

Boot Loader Lock Bits 248

Entering the Boot Loader Program 249

Addressing the Flash during Self-Programming 251

Self-Programming the Flash 252

Memory Programming 259

Program And Data Memory Lock Bits 259

Fuse Bits 260

Signature Bytes 261

Calibration Byte 261

Page Size 262

Parallel Programming Parameters, Pin Mapping, and Commands 262

Parallel Programming 265

Serial Downloading 273

Programming via the JTAG Interface 278

ATmega16 데이터시트(PDF) 353 Page - ATMEL Corporation

ATmega16 데이터시트(HTML) 353 Page - ATMEL Corporation

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