5

7792B–AVR–05/09

ATtiny87/ATtiny167 Automotive

2.

Grade 0 Qualification

The ATtiny87/ATtiny167 has been developed and manufactured according to the most strin-

gent quality assurance requirements of ISO-TS-16949 and verified during product qualification

as per AEC-Q100 grade 0.

AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature

field usage however may result in less significant stress test acceleration. In order to prevent

the risk that ATtiny87/ATtiny167 lifetime would not satisfy the application end-of-life reliability

requirements, Atmel

Operating Life Test, High Temperature Storage Life, Data Retention, Thermal Cycles), far

beyond the AEC-Q100 requirements. Thereby, Atmel verified the ATtiny87/ATtiny167 has a

long safe lifetime period after the grade 0 qualification acceptance limits.

The valid domain calculation depends on the activation energy of the potential failure mecha-

nism that is considered. Therefore any temperature mission profile which could exceed the

AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis

Figure 2-1.

AEC-Q100 Lifetime Equivalence

AEC-Q100 Lifetime Equivalence

1

10

100

1000

10000

100000

1000000

0

204060

80

100

120

140

160

Temperature (°C)

HTOL 0,59eV

HTSL 0,45eV