| 전자부품 데이터시트 검색엔진 |
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33879 데이터시트(PDF) 12 Page - Freescale Semiconductor, Inc |
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33879 데이터시트(HTML) 12 Page - Freescale Semiconductor, Inc |
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12 / 23 page ![]() Analog Integrated Circuit Device Data 12 Freescale Semiconductor 33879 ELECTRICAL CHARACTERISTICS TYPICAL ELECTRICAL CHARACTERISTICS Figure 5. Valid Data Delay Time and Valid Time Test Circuit Figure 6. Valid Data Delay Time and Valid Time Waveforms Figure 7. Enable and Disable Time Waveforms TYPICAL ELECTRICAL CHARACTERISTICS Figure 8. IPWR vs. Temperature Figure 9. Sleep State IPWR vs. Temperature DO CL = 200 pF VDD = 5.0 V SCLK 33879 Under Test NOTE: CL represents the total capacitance of the test fixture and probe. (Low-to-High) tF(DI tR(DI) 0.2 VDD 0.7 VDD 0.2 0.7 VDD tVALID tR(DO VOL VOH VOL VOH 0.2 VDD 0.7 VDD 0 V 3.3/5.0 V < 50 ns 50% < 50 ns DO SCLK (High-to-Low) DO 90% tF(CS) tR(CS) VOH VOL 0 V 3.3/5.0 V DO tDO(DIS) tDO(EN) tDO(DIS) tDO(EN) (Tri-State to Low) 0.7 VDD 0.2 VDD <50 ns <50 ns CS 90% DO (Tri-State to High) 10% 10% 90% 10% VTri-State VTri-State 025 50 100 125 -40 75 -25 14 15 16 17 18 19 20 TA, Ambient Temperature (°C) VPWR @ 18 V 33879 33879A 0 25 50 100 125 -40 75 -25 1 2 3 4 5 6 7 TA, Ambient Temperature (°C) VPWR @ 13 V |
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