ChargePumps

Overcurrent &

ShortCircuit

Protection

N-CH FET

Drive

Impedance

Track™ Gas

Gauging

Pack -

SMBus

Pack +

LDO

& Therm. Drive

& Reset

Therm

Fuse

Temperature

Measurement

& Protection

32kHzClock

Generator

System

Interface

VoltageLevel

Translator

Watchdog &

Protection

Timing

System

Interface

SHA-1

Authentication

Charging

Algorithm

SBSv1.1

Data

Cell & Pack

Voltage

Measurement

Overrcurrent

Protection

Overvoltage &

Undervoltage

Protection

CellBalancing

Algorithm &

Control

FailSafe

Protection

bq29330

Validation &

Control

bq20z40–R1

bq29330

bq294xy

SupplyVoltage

32KHz

I

Registers

Alert

RSNS

5m – 20m

typ.

Reset

bq20z40-R1

SLUS993 – DECEMBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SYSTEM PARTITIONING DIAGRAM

Figure 1.

2

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