MPC5604PEFMLL datasheet(32/84 Pages) FREESCALE

32 / 84 page

MPC5604P Microcontroller Data Sheet, Rev. 5

Preliminary—Subject to Change Without Notice

Freescale Semiconductor

3.4

Electromagnetic interference (EMI) characteristics

3.5

Electrostatic discharge (ESD) characteristics

Table 10. EMI Testing Specifications1

1 EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03.

Symbol

Parameter

Conditions

fOSC/fBUS

Frequency

Level

(Max)

Unit

Radiated

emissions,

electric field

VRE_TEM

VDD =5.5 V;

TA =+25 °C

150 kHz–30 MHz

RBW 9 kHz, Step

Size 5 kHz

30 MHz–1 GHz

RBW 120 kHz, Step

Size 80 kHz

16 MHz crystal

40 MHz bus

No PLL frequency

modulation

150 kHz–50 MHz

μV

50–150 MHz

150–500 MHz

500–1000 MHz

IEC Level

—

SAE Level

—

16 MHz crystal

40 MHz bus

±2% PLL

frequency

modulation

150 kHz–50 MHz

μV

50–150 MHz

15–500 MHz

500–1000 MHz

IEC Level

—

SAE Level

—

Table 11. ESD ratings1,2

1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated

Circuits.

2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device

specification requirements. Complete DC parametric and functional testing shall be performed per applicable

device specification at room temperature followed by hot temperature, unless specified otherwise in the device

specification

Symbol

Parameter

Conditions

Value

Unit

VESD(HBM)

SR Electrostatic discharge (Human Body Model)

—

2000

VESD(CDM)

SR Electrostatic discharge (Charged Device Model)

—

750 (corners)

500 (other)

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