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SW202233NJL 데이터시트(PDF) 7 Page - ABC Taiwan Electronics Corp |
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SW202233NJL 데이터시트(HTML) 7 Page - ABC Taiwan Electronics Corp |
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7 / 8 page ![]() appearance. Humidity test Temp.:50±2℃ 3.Load:Allowed DC current 4. Load:Allowed DC current 3.Time:1000±12 hours 2.Time:1000±12 hours 2.R.H.:90-95% 1.Temp:40±2℃ 1.Temp:85±2℃ Temp.:-40±2℃ Total:10 cycles Time.:48±2 hours Temp.:125±2℃ Time.:48±2 hours -40 for 30 minutes. ℃ +125 for 30 minutes. ℃ Time.:96±2 hours R.H.:90~95 % Humidity load life Note: Inductors are to be tested after 1 hour at room temperature. High temperature High tempera - ture load life storage test Low temperature Thermal shock test storage Inductors shall not have a shorted or open winding. 2.Inductance shall not change 3.Q shall not change more than±10% more than ±5% -40 ~125 ℃℃ of the termination to board The device shall be reflow soldered (230±5 for 10 seconds) to a tinned ℃ force gauge shall be applied to copper substrate. A dynometer the side of the component . The device must withstand the minimum force indicated at left without a failure SPECIFICATION FOR APPROVAL attachment. ABC'S ITEM NO. ABC'S DWG NO. PROD. WOUND CHIP INDUCTOR characteristic Temperature Component (Push test) adhesion NAME 1.There shall be no case deformation or change in 20N:2012,2520,3225 5N:1005 10N:1608 REF : 20080711-A SW2022□□□□L□-□□□ PAGE: 7 AR-001A |
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