Production Data

WM2619

WOLFSON MICROELECTRONICS LTD

5

Test Conditions:

Ω, C

temperature range (unless noted otherwise)

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Digital Inputs

High level input current

Input voltage = VDD

1

µA

Low level input current

Input voltage = 0V

-1

µA

Input capacitance

8

pF

Notes:

1.

Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects

of zero code and full scale errors).

2.

Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two

codes. A guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in

digital input code.

3.

Zero code error is the voltage output when the DAC input code is zero.

4.

Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.

5.

the zero code error and the gain error.

6.

Zero code error and Gain error temperature coefficients are normalised to full scale voltage.

7.

Output load regulation is the difference between the output voltage at full scale with a 10k

Ω load and 2kΩ load. It is expressed as

a percentage of the full scale output voltage with a 10k

Ω load.

8.

9.

Typical supply current in power down mode is 10nA. Production test limits are wider for speed of test.

10. Slew rate results are for the lower value of the rising and falling edge slew rates.

11. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges.

Limits are ensured by design and characterisation, but are not production tested.