WM2636CD datasheet(5/10 Pages) WOLFSON

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WM2636

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 July 1999

SERIAL INTERFACE

SUC16FS

SUFS

SCLK

DIN

NCS

D12

D13

D14

D15

SUD

SUCSFS

WHFS

SUC16CS

Figure 1 Timing Diagram

Test Conditions:

RL = 10k

Ω, CL = 100pF. VDD = 5V

± 10%, V

REF = 2.048V and VDD = 3V

± 10%, V

REF = 1.024V over recommended operating

free-air temperature range (unless noted otherwise).

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

tSUCSFS

Setup time NCS low before negative FS edge.

tSUFS

Setup time FS low before first negative SCLK edge.

8ns

tSUC16FS

Setup time, sixteenth negative edge after FS low on

which D0 is sampled before rising edge of FS.

tSUC16CS

Setup time, sixteenth positive SCLK edge (first

positive after D0 sampled) before NCS rising edge. If

FS is used instead of the sixteenth positive edge to

update the DAC, then the setup time is between the

FS rising edge and the NCS rising edge.

tWH

Pulse duration, SCLK high.

tWL

Pulse duration, SCLK low.

tSUD

Setup time, data ready before SCLK falling edge.

8ns

tHD

Hold time, data held valid after SCLK falling edge.

5ns

tWHFS

Pulse duration, FS high.

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