PESDXU1UT_SER_2

© NXP B.V. 2009. All rights reserved.

Product data sheet

Rev. 02 — 20 August 2009

9 of 13

NXP Semiconductors

PESDxU1UT series

Ultra low capacitance ESD protection diode in SOT23 package

8.

Test information

Fig 7.

ESD clamping test setup and waveforms

006aaa445

50

Ω

D.U.T.

(Device

Under

Test)

vertical scale = 200 V/div

horizontal scale = 50 ns/div

unclamped

+1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped

+1 kV ESD voltage waveform

(IEC 61000-4-2 network)

unclamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

vertical scale = 200 V/div

horizontal scale = 50 ns/div

vertical scale = 20 V/div

horizontal scale = 50 ns/div

vertical scale = 20 V/div; horizontal scale = 50 ns/div

GND

GND

450

Ω

RG 223/U

50

Ω coax

ESD TESTER

IEC 61000-4-2 network

4 GHz DIGITAL

OSCILLOSCOPE

10

×

ATTENUATOR

GND

GND

GND

GND

GND

GND

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PESD24VU1UT