MCP2003 datasheet(11/32 Pages) MICROCHIP

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 2010 Microchip Technology Inc.

DS22230A-page 11

MCP2003/4

2.0

ELECTRICAL CHARACTERISTICS

2.1

Absolute Maximum Ratings†

VIN DC Voltage on RXD, TXD, FAULT/TXE .....................................................................................................-0.3 to +30V

VIN DC Voltage on CS, WAKE and VREN .......................................................................................................-0.3 to +30V

VBB Battery Voltage, continuous ....................................................................................................................-0.3 to +30V

VBB Battery Voltage, non-operating (LIN bus recessive, t < 60s) ..................................................................-0.3 to +43V

VBB Battery Voltage, transient ISO 7637 Test 1 ......................................................................................................-200V

VBB Battery Voltage, transient ISO 7637 Test 2a ...................................................................................................+150V

VBB Battery Voltage, transient ISO 7637 Test 3a ....................................................................................................-300V

VBB Battery Voltage, transient ISO 7637 Test 3b ...................................................................................................+200V

VLBUS Bus Voltage, continuous.......................................................................................................................-18 to +30V

VLBUS Bus Voltage, transient (Note 1) ............................................................................................................-27 to +43V

ILBUS Bus Short Circuit Current Limit .................................................................................................................... 200 mA

ESD protection on LIN, VBB (IEC 61000-4-2) (Note 2) ........................................................................................... ±8 KV

ESD protection on LIN, VBB (Human Body Model) (Note 3)................................................................................... ±8 KV

ESD protection on all other pins (Human Body Model) (Note 3) ............................................................................ ±4 KV

ESD protection on all pins (Charge Device Model) (Note 4) .................................................................................. ±2 KV

ESD protection on all pins (Machine Model) (Note 5)............................................................................................. ±200V

Maximum Junction Temperature ............................................................................................................................. 150

C

Storage Temperature .................................................................................................................................. -65 to +150

C

Note 1: ISO 7637/1 load dump compliant (t < 500 ms).

2: According to IEC 61000-4-2, 330 ohm, 150 pF and Tranceiver EMC Test Specifications [2] to [4].

3: According to AEC-Q100-002/JESD22-A114.

4: According to AEC-Q100-011B.

5: According to AEC-Q100-003/JESD22-A115.

† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above those

indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for

extended periods may affect device reliability.

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