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CAT28C17API-20T 데이터시트(PDF) 4 Page - ON Semiconductor

부품명 CAT28C17API-20T
상세설명  16 kb CMOS Parallel EEPROM
PDF  12 Pages
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제조업체  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
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CAT28C17API-20T 데이터시트(HTML) 4 Page - ON Semiconductor

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Table 4. RELIABILITY CHARACTERISTICS (Note 4)
Symbol
Parameter
Test Method
Min
Max
Units
NEND
Endurance
MIL−STD−883, Test Method 1033
10,000
Cycles/Byte
TDR
Data Retention
MIL−STD−883, Test Method 1008
10
Years
VZAP
ESD Susceptibility
MIL−STD−883, Test Method 3015
2,000
V
ILTH (Note 5)
Latch−Up
JEDEC Standard 17
100
mA
4. This parameter is tested initially and after a design or process change that affects the parameter.
5. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V.
Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Limits
Units
Min
Typ
Max
ICC
VCC Current (Operating, TTL)
CE = OE = VIL,
f = 1/tRC min, All I/O’s Open
35
mA
ICCC (Note 6)
VCC Current (Operating, CMOS)
CE = OE = VILC,
f = 1/tRC min, All I/O’s Open
25
mA
ISB
VCC Current (Standby, TTL)
CE = VIH, All I/O’s Open
1
mA
ISBC (Note 7)
VCC Current (Standby, CMOS)
CE = VIHC, All I/O’s Open
100
mA
ILI
Input Leakage Current
VIN = GND to VCC
−10
10
mA
ILO
Output Leakage Current
VOUT = GND to VCC,
CE = VIH
−10
10
mA
VIH (Note 7)
High Level Input Voltage
2
VCC + 0.3
V
VIL (Note 6)
Low Level Input Voltage
−0.3
0.8
V
VOH
High Level Output Voltage
IOH = −400 mA
2.4
V
VOL
Low Level Output Voltage
IOL = 2.1 mA
0.4
V
VWI
Write Inhibit Voltage
3.0
V
6. VILC = −0.3 V to +0.3 V
7. VIHC = VCC −0.3 V to VCC + 0.3 V
Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.)
Symbol
Parameter
28C17A−20
Units
Min
Max
tRC
Read Cycle Time
200
ns
tCE
CE Access Time
200
ns
tAA
Address Access Time
200
ns
tOE
OE Access Time
80
ns
tLZ (Note 8)
CE Low to Active Output
0
ns
tOLZ (Note 8)
OE Low to Active Output
0
ns
tHZ (Notes 8, 9)
CE High to High−Z Output
55
ns
tOHZ (Notes 8, 9)
OE High to High−Z Output
55
ns
tOH (Note 8)
Output Hold from Address Change
0
ns
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.



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