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CAT1232LP 데이터시트(PDF) 2 Page - ON Semiconductor |
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CAT1232LP 데이터시트(HTML) 2 Page - ON Semiconductor |
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2 / 12 page ![]() CAT1232LP, CAT1832 Doc. No. MD-3018 Rev. F 2 © 2009 SCILLC. All rights reserved. Characteristics subject to change without notice PIN CONFIGURATION SOIC 8 Lead MSOP 8 Lead PDIP 8 Lead PBRST ¯¯¯¯¯¯ 1 8 VCC TD 2 7 ST ¯¯ TOL 3 6 RESET ¯¯¯¯¯¯ GND 4 5 RESET CAT SOIC 16 Lead NC 1 16 NC PBRST ¯¯¯¯¯¯ 2 15 VCC NC 3 14 NC TD 4 13 ST ¯¯ NC 5 12 NC TOL 6 11 RESET ¯¯¯¯¯¯ NC 7 10 NC GND 8 9 RESET CAT PIN DESCRIPTION Pin Number 8-Lead Package Pin Number 16-Lead Package Name Function 1 2 PBRST ¯¯¯¯¯¯ Debounced manual pushbutton reset input 2 4 TD Watchdog typical time delay selection: a) tTD = 150 ms for TD = GND b) tTD = 600 ms for TD = Open c) tTD = 1200 ms for TD = VCC 3 6 TOL CAT1232LP TOL selects 5% (TOL = GND) or 10% (TOL = VCC) trip point tolerance. CAT1832 TOL selects 10% (TOL = GND) or 20% TOL = VCC) trip point tolerance. 4 8 GND Ground 5 9 RESET Active HIGH reset output. RESET is active 1. If VCC falls below the reset voltage trip point 2. If PBRST ¯¯¯¯¯¯ is low 3. If ST ¯¯ is not strobed low before the timeout period set by TD expires. 4. During power-up. 6 11 RESET Active LOW reset output. (See RESET) 7 13 ST ¯¯ Strobe Input 8 15 VCC Power Supply 1, 3. 5, 7, 10, 12, 14, 16 NC No internal connection ABSOLUTE MAXIMUM RATINGS (*) Parameters Ratings Units Voltage on VCC -0.5 to 7.0 V Voltage on ST ¯¯ and TD -0.5 to VCC + 0.5 V Voltage on PBRST ¯¯¯¯¯¯, RESET ¯¯¯¯¯¯and RESET -0.5 to VCC + 0.5 V Parameters Ratings Units Maximum Junction Temperature 125 ºC Storage Temperature Range -65 to +150 ºC Lead Soldering Temperature (10s) 300 ºC Operating Temperature Range -40 to +85 ºC Note: * Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. |
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