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MRF24WB0MA/RM 데이터시트(PDF) 15 Page - Microchip Technology |
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MRF24WB0MA/RM 데이터시트(HTML) 15 Page - Microchip Technology |
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15 / 34 page ![]() 2010 Microchip Technology Inc. DS70632A-page 15 MRF24WB0MA/MRF24WB0MB 2.3.4 STANDBY STATE The Standby state is not user-controlled but is noted as it helps identify and track certain operations of the module during power tracing. FIGURE 2-3: MRF24WB0MA/MRF24WB0MB POWER-STATE DIAGRAM 2.4 JTAG Interface Joint Test Action Group (JTAG) is the common name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary-Scan Architecture for test access ports that are used for testing printed circuit boards using boundary scan. The MRF24WB0MA/ MRF24WB0MB supports JTAG boundary scan. The JTAG port provides the optional hardware JTAG Reset input, JTAGRST. JTAG_EN and JTAGRST need to be driven high to enable JTAG mode. JTAG should not be enabled during normal functional operation. This func- tion affects power state current. 2.5 Debug Serial Interface The MRF24WB0MA/MRF24WB0MB incorporates a Transmitted Data pin (DEBUGTX) and a Received Data pin (DEBUGRX) for serial debugging purposes. These pins can be connected to commercially available RS- 232 line drivers/receivers with appropriate external level shifters. The serial interface is fully tested at 115200 bits/seconds with RS-232/UART interface applications. TABLE 2-1: MRF24WB0MA/MRF24WB0MB POWER STATE DEFINITIONS State VDD CS Description Off 0V 0V Power is completely disconnected Hibernate 3.3V 3.3V All internal power regulators are OFF – enabled by HIBERNATE pin Sleep 3.3V 0V Enabled by TCPIP driver RX ON 3.3V 0V Receive circuits are on and receiving TX ON 3.3V 0V Transmit circuits are on and transmitting Standby 3.3V 0V State machine transition state only – not user controlled Off Hibernate Standby RX On TX On Sleep 200 us 200 us 10 us Note 1 Note 1 Note 1: See Section 2.2. |
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