| 전자부품 데이터시트 검색엔진 |
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CLP200M-TR 데이터시트(PDF) 11 Page - STMicroelectronics |
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CLP200M-TR 데이터시트(HTML) 11 Page - STMicroelectronics |
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11 / 21 page ![]() Obsolete Product(s) - Obsolete Product(s) CLP200M 11/21 Fig. 22 : CLP200M response to a positive surge. Fig. 23 : CLP200 M response to a negative surge. Fig. 24 : Power induction test. 4 Ω TIPL TIPS GND 1/2 CLP200M I V1 50 I2 SLIC LCP1511D -48V V2 1 Rsense Rp V(RMS) 50 Hz TEST V(RMS) R( Ω) Duration 3a 300 600 0.2s Fig. 25 : Induction test behavior (Test 3a). Figures 22 and 23 give the voltage and current be- havior during positive and negative 4kV, 10/700 µs, surge tests using a LCP1511D as second stage protection device. The firing threshold values are now adjusted to GND and to -Vbat (-48V) by the action of the second stage protection which acts as an external voltage reference. As shown on these figures, the maximum remain- ing voltage does not exceed +2.5V for positive surges and -60V for negative surges. Consequently, the CLP200M totally fulfills this test. 3.3.2 Power induction test (Test 3a and 3b, table 2/K20) Figures 25 and 26 show that the maximum remain- ing voltage does not exceed +2V for positive surges and -55V for negative surges. Consequently, the CLP200M totally fulfills this test. The test duration is not specified in test 3b. If the duration exceeds 5s we do suggest to follow the soldering and mounting recommendations given on page 17 of this document. |
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