LM2575, NCV2575

http://onsemi.com

2

Figure 1. Block Diagram and Typical Application

7.0 V - 40 V

Unregulated

DC Input

L1

330

mH

GND

1

100

mF

3ON/OFF

5

Output

2

Feedback

4

D1

1N5819

330

mF

Typical Application (Fixed Output Voltage Versions)

Representative Block Diagram and Typical Application

Unregulated

DC Input

1

Feedback

4

L1

D1

R2

R1

1.0 k

Output

2

GND

3

ON/OFF

5

Reset

Latch

Thermal

Shutdown

52 kHz

Oscillator

1.235 V

Band-Gap

Reference

Freq

Shift

18 kHz

Comparator

Fixed Gain

Error Amplifier

Current

Limit

Driver

1.0 Amp

Switch

ON/OFF

3.1 V Internal

Regulator

Regulated

Output

Load

Output

Voltage Versions

3.3 V

5.0 V

12 V

15 V

R2

(

W)

1.7 k

3.1 k

8.84 k

11.3 k

For adjustable version

R1 = open, R2 = 0

W

LM2575

5.0 V Regulated

Output 1.0 A Load

This device contains 162 active transistors.

Rating

Symbol

Value

Unit

Maximum Supply Voltage

45

V

ON/OFF Pin Input Voltage

−

V

Output Voltage to Ground (Steady−State)

−

−1.0

V

Power Dissipation

Case 314B and 314D (TO−220, 5−Lead)

Internally Limited

W

Thermal Resistance, Junction−to−Ambient

65

°C/W

Thermal Resistance, Junction−to−Case

5.0

°C/W

Internally Limited

W

Thermal Resistance, Junction−to−Ambient (Figure 34)

70

°C/W

Thermal Resistance, Junction−to−Case

5.0

°C/W

Storage Temperature Range

−65 to +150

°C

Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 kW)

−

2.0

kV

Lead Temperature (Soldering, 10 s)

−

260

°C

Maximum Junction Temperature

150

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.