Data Sheet

9

Rev. 1.1, 2009-05-19

TLE42994

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

-40 °C

(unless otherwise specified)

1) not subject to production test, specified by design

Pos.

Parameter

Symbol

Limit Values

Unit

Conditions

Min.

Max.

Input I, Enable Input EN, Sense Input SI

4.1.1

Voltage

V

V

SI

-40

45

V

–

Output Q, Reset Output RO, Sense Output SO

4.1.2

Voltage

V

V

SO

-0.3

7

V

–

Reset Delay D, Reset Threshold RADJ

4.1.3

Voltage

V

-0.3

7

V

–

Temperature

4.1.4

Junction Temperature

T

j

-40

150

°C–

4.1.5

Storage Temperature

T

stg

-50

150

°C–

ESD Absorption

4.1.6

ESD Absorption

V

ESD,HBM

-2

2

kV

Human Body

2) ESD susceptibility Human Body Model “HBM” according to AEC-Q100-002 - JESD22-A114

4.1.7

V

ESD,CDM

-500

500

V

Charge Device

3) ESD susceptibility Charged Device Model “CDM” according to ESDA STM5.3.1

4.1.8

-750

750

V

Charge Device

Model (CDM)3) at

corner pins