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AD8231ACPZ-R7 데이터시트(PDF) 7 Page - Analog Devices

부품명 AD8231ACPZ-R7
상세설명  Zero Drift, Digitally Programmable Instrumentation Amplifier
PDF  24 Pages
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제조업체  AD [Analog Devices]
홈페이지  http://www.analog.com
Logo AD - Analog Devices

AD8231ACPZ-R7 데이터시트(HTML) 7 Page - Analog Devices

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AD8231
Rev. A | Page 7 of 24
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 4.
Parameter
Rating
Table 5.
Supply Voltage
6 V
Thermal Pad
θ
Unit
JA
Output Short-Circuit Current
Indefinite1
Soldered to Board
54
°C/W
Input Voltage (Common-Mode)
−VS − 0.3 V to +VS + 0.3 V
Not Soldered to Board
96
°C/W
Differential Input Voltage
−VS − 0.3 V to +VS + 0.3 V
The θ values in Table 5
Storage Temperature Range
–65°C to +150°C
JA
assume a 4-layer JEDEC standard
board. If the thermal pad is soldered to the board, it is
also assumed it is connected to a plane. θ
Operational Temperature Range
–40°C to +125°C
Package Glass Transition Temperature
130°C
JC
at the exposed pad
is 6.3°C/W.
ESD (Human Body Model)
1.5 kV
MAXIMUM POWER DISSIPATION
ESD (Charged Device Model)
1.5 kV
ESD (Machine Model)
0.2 kV
The maximum safe power dissipation for the AD8231 is limited
by the associated rise in junction temperature (T
1 For junction temperatures between 105°C and 130°C, short-circuit operation
beyond 1000 hours can impact part reliability.
J
) on the die. At
approximately 130°C, which is the glass transition temperature,
the plastic changes its properties. Even temporarily exceeding
this temperature limit may change the stresses that the package
exerts on the die, permanently shifting the parametric perform-
ance of the amplifiers. Exceeding a temperature of 130°C for an
extended period can result in a loss of functionality.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION



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