Analog Integrated Circuit Device Data

Freescale Semiconductor

13

33480

DYNAMIC ELECTRICAL CHARACTERISTICS

I/O PLAUSIBILITY CHECK TIMING (CONTINUED)

High Overcurrent Threshold Time 1

for OUT1 and OUT5

for OUT2:4

7

14

10

20

13

26

ms

High Overcurrent Threshold Time 2

for OUT1 and OUT5

for OUT2:4

52.5

105

75

150

97.5

195

ms

Autorestart Period

for OUT1 and OUT5

for OUT2

52.5

105

75

150

97.5

195

ms

Autorestart Overcurrent Shutdown Delay Time

for OUT1 and OUT5

for OUT2

3.5

7.0

5.0

10.0

6.5

13.0

ms

Limp Home Input pin Deglicher Time

7.0

10.0

13.0

ms

105

150

195

ms

Flasher Toggle Timeout

1.4

TBD

TBD

s

Ignition Toggle Timeout

1.4

TBD

TBD

s

Clock Input Low Frequency Detection Range

1.0

2.0

4.0

kHz

Clock Input High Frequency Detection Range

100

200

400

kHz

Notes

35.

available in ON state.See Figure 4, Input Timing Switching Characteristics

36.

Linear range is defined by output duty cycle to SPI duty cycle configuration +/-1 LSB. For values outside linear duty cycle range, a

calibration curve is available.

37.

IOLLEDn bit (where “n” corresponds to respective outputs 1 through 5) in SI data is set to logic [1]. Refer to Table 8, Serial Input Address

and Configuration Bit Map, page 28.

Table 4. Dynamic Electrical Characteristics

Characteristics noted under conditions 4.5 V

otherwise noted.

Characteristic

Symbol

Min

Typ

Max

Unit