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33981 데이터시트(PDF) 24 Page - Freescale Semiconductor, Inc |
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33981 데이터시트(HTML) 24 Page - Freescale Semiconductor, Inc |
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24 / 37 page ![]() Analog Integrated Circuit Device Data 24 Freescale Semiconductor 33981 TYPICAL APPLICATIONS EMC AND EMI RECOMMENDATIONS Figure 24. Test Bench for Radiated Emission EMC RESULTS AND IMPROVEMENTS The 33981 OUT is connected to an inductive load (0.47 Ω + 1.0mH) switching at 20 kHz with duty = 80%. The current in the load was 17 A continuous. BOARD SETUP The initial configuration of our 33981 board is represented in Figure 25. No SR capacitor is used. Therefore, the obtained switching times are the maximum values. A capacitor of 1000 μF is connected between VPWR and GND. Figure 25. 33981 Initial Configuration CONDUCTED MEASUREMENTS TEST SETUP To perform a conducted emission measurement in accordance with the CISPR 25 standard, the test bench in Figure 26, Conducted Emission Test Setup, on page 24 was developed. Figure 26. Conducted Emission Test Setup EFFECTS OF SOME PARAMETERS The conducted emissions level rise with the duty cycle. When the duty increases the di/dt on the VPWR line is higher. The device has to deliver more current and provide more energy. Figure 27 describes the effect of duty cycle increase on the VPWR current waveform. The conducted emission level rises with the output frequency. This is due to the increasing number of commutations. Key 1 EUT (grounded locally if required in test plan) 8 Biconical antenna 2 Test harness – – 3 Load simulator (placement and ground connection) 10 High quality double- shielded coaxial cable (50 Ω) 4 Power supply (location optional) 11 Bulkhead connector 5 Artificial Network (AN) 12 Measuring instrument 6 Ground plane (bonded to shielded enclosure) 13 RF absorber material 7 Low relative permittivity support ( ερ ≤ 1.4) 14 Stimulation and monitoring system Out GND VPWR 33981 Power Supply LISN Measurement Point for Conducted Emission EUT Non-Conductive Material Optical PWM Signal Load (1.0 mH + 0.4 Ω) |
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