| 전자부품 데이터시트 검색엔진 |
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MCP3301T 데이터시트(PDF) 6 Page - Microchip Technology |
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MCP3301T 데이터시트(HTML) 6 Page - Microchip Technology |
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6 / 38 page ![]() MCP3301 DS21700D-page 6 2011 Microchip Technology Inc. 1.1 Test Circuits FIGURE 1-2: Load circuit for tR, tF, tDO. FIGURE 1-3: Load circuit for TDIS and TEN. FIGURE 1-4: Power Supply Sensitivity Test Circuit (PSRR). FIGURE 1-5: Full Differential Test Configuration Example. FIGURE 1-6: Pseudo Differential Test Configuration Example. Test Point 1.4V DOUT 3k CL = 100 pF *Waveform 1 is for an output with internal conditions such that the output is high, unless disabled by the output control. †Waveform 2 is for an output with internal conditions such that the output is low, unless disabled by the output control. VIH TDIS CS DOUT Waveform 1* DOUT Waveform 2† 90% 10% Voltage Waveforms for tDIS Test Point DOUT 3k 100 pF tDIS Waveform 2 tDIS Waveform 1 tEN Waveform VDD VDD/2 VSS 2.63V - + 1k 5V ±500 mVp-p 5VP-P 1k 20 k To VDD on DUT 1k 1/2 MCP602 VDD = 5V 0.1 µF IN(+) IN(-) MCP3301 5VP-P VREF = 5V 5VP-P VCM = 2.5V 1µF 0.1 µF VREFVDD VSS 0.1 µF IN(+) IN(-) MCP3301 VDD=5V VCM=2.5V 5VP-P VREF=2.5V 1µF 0.1 µF VREFVDD VSS |
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