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LE28C1001M 데이터시트(PDF) 7 Page - Sanyo Semicon Device |
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LE28C1001M 데이터시트(HTML) 7 Page - Sanyo Semicon Device |
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7 / 14 page ![]() AC Electrical Characteristics at Ta = 0 to +70°C, VCC = 5 V ± 10% AC Testing Conditions (See Figure 9) Input rise and fall times: ................10 ns (max.) Output load: ....................................1 TTL gate + 100 pF Read Cycle Page Write Cycle Note: * typ is a reference value at VCC = 5.0, Ta = 25 °C. Figure 1 Read Cycle No. 5129-7/14 LE28C1001M, T-90/12/15 Parameter Symbol min typ* max Unit Write cycle time (erase and program) tWC 5 10 ms Address setup time tAS 0 ns Address hold time tAH 50 ns CE setup time tCS 0 ns CE hold time tCH 0 ns OE setup time tOES 0 ns OE hold time tOEH 0 ns CE pulse width tCP 70 ns WE pulse width tWP 70 ns Data setup time tDS 45 ns Data hold time tDH 0 ns Byte load cycle time tBLC 0.05 100 µs Byte load timeout time tBLCO 200 µs LE28C1001M, T Parameter Symbol -90 -12 -15 Unit min max min max min max Read cycle time tRC 90 120 150 ns CE access time tCE 90 120 150 ns Address access time tAA 90 120 150 ns OE access time tOE 50 60 70 ns Output low-impedance time from CE tCLZ 0 0 0 ns Output low-impedance time from OE tOLZ 0 0 0 ns Output high-impedance time from CE tCHZ 40 40 40 ns Output high-impedance time from OE tOHZ 40 40 40 ns Output valid time from address input tOH 0 0 0 ns A05761 |
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