| 전자부품 데이터시트 검색엔진 |
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D2013 데이터시트(PDF) 2 Page - Seme LAB |
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D2013 데이터시트(HTML) 2 Page - Seme LAB |
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2 / 4 page ![]() Parameter Test Conditions Min. Typ. Max. Unit D2013UK Prelim.12/00 Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk 65 1 1 17 0.72 10 40 20:1 48 24 2 VGS = 0 ID = 10mA VDS = 28V VGS = 0 VGS = 20V VDS = 0 ID = 10mA VDS = VGS VDS = 10V ID = 0.8A PO = 20W VDS = 28V IDQ = 0.8A f = 1GHz VDS = 0 VGS = –5V f = 1MHz VDS = 28V VGS = 0 f = 1MHz VDS = 28V VGS = 0 f = 1MHz V mA mA V S dB % — pF pF pF ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated) Drain–Source BVDSS Breakdown Voltage Zero Gate Voltage IDSS Drain Current IGSS Gate Leakage Current VGS(th) Gate Threshold Voltage * gfs Forward Transconductance * GPS Common Source Power Gain h Drain Efficiency VSWR Load Mismatch Tolerance Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance HAZARDOUS MATERIAL WARNING The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly toxic and care must be taken during handling and mounting to avoid damage to this area. THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE. RTHj–case Thermal Resistance Junction – Case Max. 2.1°C / W THERMAL DATA * Pulse Test: Pulse Duration = 300 ms , Duty Cycle £ 2% TOTAL DEVICE PER SIDE PER SIDE |
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