AMC80

www.ti.com

SBOS559

– MAY 2011

ELECTRICAL CHARACTERISTICS

AMC80

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DIGITAL INPUTS

Input high voltage

2

V

Input low voltage

0.8

V

V+ = 3.3 V

0.23

V

Hysteresis voltage

V+ = 5 V

0.33

V

–1

–0.005

µA

Input high current

–10

–1

µA

0.005

1

µA

Input low current

2

mA

Input capacitance

20

pF

ANALOG INPUTS

Default

0

2.56

V

Input voltage range

Programmable

0

V+

V

Input leakage current (on)

±0.005

µA

Input leakage current (off)

±0.005

µA

Input resistance

2

10

k

Ω

DIGITAL OUTPUTS (A0/NTEST_OUT, INT)

Output high voltage

2.4

V

Output low voltage

0.4

V

DIGITAL OPEN-DRAIN OUTPUTS (GPO, RST_OUT/OS, GPI/CI, SDA)

0.4

V

all pins except SDA

Output low voltage

0.4

V

Output high current

0.005

1

µA

PW

Pulse duration

RST_OUT/OS, GPI/CI

10

22.5

ms

TEMPERATURE ERROR

±3

°C

Temperature error

±2

°C

Temperature resolution

0.0625

°C

ANALOG-TO-DIGITAL CONVERTER

2.5

mV

Resolution

6

mV

DNL

Differential linearity

–1

1

–1

1

%

PSRR

Power supply rejection ratio

±0.0008

%

(3)

Total conversion time

662

728

810

ms

(1)

LSB means least significant bit.

(2)

Total unadjusted error contains offset, gain, and linearity errors of the ADC.

(3)

Total conversion time contains the temperature conversion, the seven analog input voltage conversions, and the two tachometer

readings.

Copyright

© 2011, Texas Instruments Incorporated

Submit Documentation Feedback

3

Product Folder Link(s): AMC80