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MJD210L-TN3-R 데이터시트(PDF) 2 Page - Unisonic Technologies |
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MJD210L-TN3-R 데이터시트(HTML) 2 Page - Unisonic Technologies |
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2 / 5 page ![]() MJD210 PNP SILICON TRANSISTOR UNISONICTECHNOLOGIESCO.,LTD 2 of 5 www.unisonic.com.tw QW-R213-001.C ABSOLUTE MAXIMUM RATINGS (Ta=25°C, unless otherwise specified) PARAMETER SYMBOL RATINGS UNIT Collector-Base Voltage VCBO -40 V Collector-Emitter Voltage VCEO -25 V Emitter-Base Voltage VEBO -7 V Continuous -5 A Collector Current Peak IC -10 A Base Current IB -1 A TC=25°C 12.5 W Derate above 25 °C0.1 W/ °C Ta=25 °C (Note2) 1.4 W Total Device Dissipation Derate above 25 °C PD 0.011 W/ °C Junction Temperature TJ +150 °C Storage Junction Temperature TSTG -65 ~ +150 °C Note: 1.Absolute maximum ratings are those values beyond which the device could be permanently damaged. Absolute maximum ratings are stress ratings only and functional device operation is not implied. 2. When surface mounted on minimum pad sizes recommended. THERMAL DATA (Ta=25°C, unless otherwise specified) PARAMETER SYMBOL RATING UNIT Junction to Ambient θJA 89.3 °C/W Junction to Case θJC 10 °C/W ELECTRICAL CHARACTERISTICS (Ta=25°C, unless otherwise specified) PARAMETER SYMBOL TEST CONDITIONS MIN MAX UNIT OFF CHARACTERISTICS Collector-Emitter Sustaining Voltage(Note 1) VCEO(SUS) IC=-10mA, IB=0 -25 V VCB=-40V, IE=0 -100 nA Collector Cutoff Current ICBO VCB=-40V, IE=0, TJ=125°C -100 nA Emitter Cutoff Current IEBO VBE=-7V, IC=0 -100 nA ON CHARACTERISTICS IC=-500mA, VCE=-1V 70 IC=-2A, VCE=-1V 45 180 DC Current Gain (Note 1) hFE IC=-5A, VCE=-2V 10 IC=-500mA, IB=-50mA -0.3 IC=-2A, IB=-200mA -0.75 Collector-Emitter Saturation Voltage (Note 1) VCE(SAT) IC=-5A, IB=-1A -1.8 V Base-Emitter Saturation Voltage (Note 1) VBE(SAT) IC=-5A, IB=-1A -2.5 V Base-Emitter On Voltage (Note 1) VBE(ON) IC=-2A, VCE=-1V -1.6 V DYNAMIC CHARACTERISTICS Current-Gain-Bandwidth Product (Note 2) fT IC=-100mA, VCE=-10V, fTEST = 10MHz 65 MHz Output Capacitance COB VCB=-10V, IE=0, f=0.1MHz 120 pF Note: 1. Pulse Test: Pulse Width = 300μs, Duty Cycle ≈ 2%. 2. fT =|hFE|‧fTEST. |
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