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ADS4128 데이터시트(PDF) 13 Page - Texas Instruments

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부품명 ADS4128
상세설명  12-Bit, 200-MSPS, Ultralow-Power ADC
PDF  61 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI - Texas Instruments

ADS4128 데이터시트(HTML) 13 Page - Texas Instruments

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background image
Dn_Dn+1_P
Dn_Dn+1_M
GND
Logic0
V
ODL
Logic1
V
ODH
V
OCM
ADS4128
www.ti.com
SBAS578 – MAY 2012
TIMING CHARACTERISTICS
(1) With external 100-
Ω termination.
Figure 4. LVDS Output Voltage Levels
TIMING REQUIREMENTS: LVDS and CMOS Modes
(1)
Typical values are at +25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, sine wave input clock,
CLOAD = 5 pF
(2), and R
LOAD = 100 Ω
(3), unless otherwise noted. Minimum and maximum values are across the full temperature
range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8 V, and DRVDD = 1.7 V to 1.9 V.
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
tA
Aperture delay
0.6
0.8
1.2
ns
Between two devices at the same temperature and DRVDD
Aperture delay variation
±100
ps
supply
tJ
Aperture jitter
100
fS rms
Time to valid data after coming out of STANDBY mode
5
25
µs
Wakeup time
Time to valid data after coming out of PDN GLOBAL mode
100
500
µs
Clock
Low-latency mode (default after reset)
10
cycles
Low-latency mode disabled
Clock
ADC latency(4)
16
(gain enabled, offset correction disabled)
cycles
Low-latency mode disabled
Clock
17
(gain and offset correction enabled)
cycles
DDR LVDS MODE(5)(6)
tSU
Data setup time(3)
Data valid(7) to zero-crossing of CLKOUTP
1.05
1.55
ns
tH
Data hold time(3)
Zero-crossing of CLKOUTP to data becoming invalid(7)
0.35
0.6
ns
Input clock rising edge crossover to output clock rising edge
tPDI
Clock propagation delay
crossover
3
4.2
5.4
ns
1 MSPS ≤ sampling frequency ≤ 200 MSPS
Between two devices at the same temperature and DRVDD
Variation of tPDI
±0.6
ns
supply
(1)
Timing parameters are ensured by design and characterization but are not production tested.
(2)
CLOAD is the effective external single-ended load capacitance between each output pin and ground.
(3)
RLOAD is the differential load resistance between the LVDS output pair.
(4)
At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1.
(5)
Measurements are done with a transmission line of 100-
Ω characteristic impedance between the device and the load. Setup and hold
time specifications take into account the effect of jitter on the output data and clock.
(6)
The LVDS timings are unchanged for low latency disabled and enabled.
(7)
Data valid refers to a logic high of 1.26 V and a logic low of 0.54 V.
Copyright © 2012, Texas Instruments Incorporated
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