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SLOU330 데이터시트(PDF) 6 Page - Texas Instruments |
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SLOU330 데이터시트(HTML) 6 Page - Texas Instruments |
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6 / 18 page ![]() Select AFE722x for ADC Perform FFT capture Enter ADC sampling rate Enter desired input frequency DCLK Data Initial EVM Setup and Basic Test Procedure www.ti.com 4.3 TX Path Using TSW3100 First the AFE722x digital interface needs to be configured to match the serial LVDS interface from the TSW3100. The following control registers need to be set in the ‘General Setup’ tab of the AFE722x programming software. Also the USB communication warning sign should be monitored after the USB reset to ensure proper communication with the AFE722x EVM. Table 1. Control Registers Register Bit Setting Interface Serial LVDS Master Override Enabled Serial LVDS 2 Wire Data Orientation MSB first Format 2s Complement Clock Delay Enabled Clock Delay 300ps Frame Clock Delay Disabled Frame Clock Delay 0ps The data coming from the TSW3100 is edge aligned while the AFE722x expects the serial LVDS data to arrive edge centered. Here the programmable clock delay inside the AFE722x can be used to delay the edge aligned clock closer towards the center of the data. The table below shows clock delays for listed DAC sampling rates that showed proper operation. 6 EVM Description SLOU330 – December 2011 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated |
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