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BAS40WS

Document ID

Issued Date

Revised Date

Revision

Page.

Small Signal Schottky Diode

1. Solder Resistance

2. Solderability

3. High Temperature Reverse Bias

4. Forward Operation Life

5. Intermittent Operation Life

6. Pressure Cooker

7. Temperature Cycling

8. Thermal Shock

9. Forward Surge

10. Humidity

11. High Temperature Storage Life

at 260 5

for 10 2sec.

immerse body into solder 1/16" 1/32"

at 245 5

for 5 sec.

V =80% rate at T =125

for 168 hrs.

Rated average rectifier current at T =25

for 500hrs.

T = 25 C, I = I

On state: power on for 5 min.

off state: power off for 5 min.

on and off for 500 cycles.

15P

at T =121

for 4 hrs.

-55

to +125

dwelled for 30 min.

and transferred for 5min. total 10 cycles.

0

for 5 min. rise to 100

for 5 min. total 10 cycles.

at T =85

, RH=85% for 1000hrs.

at 175

for 1000 hrs.

±C

±

±

±C

C

C

C

CC

CC

Peak forward surge current @ t < 1.0s

C

C

O

O

O

O

O

OO

OO

O

O

RJ

A

AF

O

SIG

A

A

O

MIL-STD-750D

METHOD-2031

MIL-STD-202F

METHOD-208

MIL-STD-750D

METHOD-1038

MIL-STD-750D

METHOD-1027

MIL-STD-750D

METHOD-1036

JESD22-A102

MIL-STD-750D

METHOD-1051

MIL-STD-750D

METHOD-1056

MIL-STD-750D

METHOD-4066-2

MIL-STD-750D

METHOD-1021

MIL-STD-750D

METHOD-1031

Item Test

Conditions

Reference

High reliability test capabilities

DS-22161X

2008/02/10

2010/03/10

B

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