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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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S29AS016J 데이터시트(PDF) 46 Page - SPANSION |
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S29AS016J 데이터시트(HTML) 46 Page - SPANSION |
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46 / 60 page  46 S29AS016J S29AS016J_00_11 February 1, 2012 Da ta Sh e e t 18. AC Characteristics 18.1 Read Operations Notes 1. Not 100% tested. 2. See Figure 16.1 on page 45 and Table 16.1 on page 45 for test specifications. 3. tRC must be same or longer than 70 ns right before read access to the flash (for devices with model numbers 01 and 02 only). Figure 18.1 Read Operations Timings Parameter Description Speed Options JEDEC Std Test Setup 70 Unit tAVAV tRC Read Cycle Time (Note 1) Min 70 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 70 tELQV tCE Chip Enable to Output Delay OE# = VIL Max 70 tGLQV tOE Output Enable to Output Delay Max 25 tEHQZ tDF Chip Enable to Output High-Z (Note 1) Max 25 tGHQZ tDF Output Enable to Output High-Z (Note 1) Max 25 tOEH Output Enable Hold Time (Note 1) Read Min 0 Toggle and Data# Polling Min 10 tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1) Min 0 tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tSR/W tOH |
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