| 전자부품 데이터시트 검색엔진 |
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RT9526AGE 데이터시트(PDF) 4 Page - Richtek Technology Corporation |
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RT9526AGE 데이터시트(HTML) 4 Page - Richtek Technology Corporation |
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4 / 10 page ![]() RT9526A 4 DS9526A-01 April 2011 www.richtek.com Note 1. Stresses listed as the above “Absolute Maximum Ratings” may cause permanent damage to the device. These are for stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may remain possibility to affect device reliability. Note 2. θJA is measured in natural convection at TA = 25°C on a low-effective thermal conductivity test board of JEDEC 51-3 thermal measurement standard. The measurement case position of θJC is on the exposed pad of the packages. Note 3. The device is not guaranteed to function outside its operating conditions. Parameter Symbol Test Conditions Min Typ Max Unit EOC Current Setting IIMIN RIMIN = 243kΩ -- 45 -- mA EOC Rising Threshold RIREF = 24.3kΩ 337.5 375 412.5 mA |
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